FinFETs with deposited fin bodies

ABSTRACT

Electronic apparatus, systems, and methods in a variety of applications can include a fin field effect transistor (FinFET) having a deposited fin body. Such a FinFET can be implemented as an access transistor in a circuit of an integrated circuit. In an embodiment, an array of FinFETs having a deposited fin bodies can be disposed on digitlines. For the array of FinFETs having a deposited fin bodies structured in memory cells of a memory, the digitlines can be coupled to sense amplifiers. Additional apparatus, systems, and methods are disclosed.

PRIORITY APPLICATION

This application is a continuation of U.S. application Ser. No.15/598,894, filed May 18, 2017, which is incorporated herein byreference in its entirety.

BACKGROUND

The semiconductor device industry has a market-driven need to improvethe operation of electronic devices. For example, improvements to thesize and/or avoidance of processing remnants of various types oftransistor devices are desired. Such transistors can be used in avariety of applications such as, but not limited to, memory devices. Onesuch transistor is the fin-type field-effect transistors (FinFET).FinFETs can have a fin-based, multigate transistor architecture.Improvements in transistors such as FinFETs can be addressed by advancesin device design and/or processing.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a flow diagram of features of an example method of fabricatinga fin-type field-effect transistor with a deposited fin body, inaccordance with various embodiments.

FIG. 2 is a flow diagram of features of an example method of fabricatinga memory device having multiple fin-type field-effect transistors withdeposited fin bodies, in accordance with various embodiments.

FIGS. 3-14 illustrate features for an example process that formsdeposited fin bodies of fin-type field-effect transistors in an array ina device, in accordance with various embodiments.

FIG. 15 is a block diagram of an example memory device, in accordancewith various embodiments.

FIG. 16 shows a finished wafer, in accordance with various embodiments.

FIG. 17 shows a block diagram of various features of an electronicsystem, in accordance with various embodiments.

DETAILED DESCRIPTION

The following detailed description refers to the accompanying drawingsthat show, by way of illustration, various embodiments of the invention.These embodiments are described in sufficient detail to enable those ofordinary skill in the art to practice these and other embodiments. Otherembodiments may be utilized, and structural, logical, and electricalchanges may be made to these embodiments. The various embodiments arenot necessarily mutually exclusive, as some embodiments can be combinedwith one or more other embodiments to form new embodiments. Thefollowing detailed description is, therefore, not to be taken in alimiting sense.

In various embodiments, a FinFET can be structured with a deposited filmas the fin body of the FinFET. A deposited fin body is a fin structureformed substantially by deposition of material for the deposited finbody without significant removal of the material deposited. The fin bodyis structured to include the channel for the transistor. The fin bodycan be a polycrystalline (herein, also referred to as poly)semiconductor, in which the deposited film is very thin. The poly can berealized by poly silicon. Other poly semiconductor materials orcombination of semiconductor materials can be used, such as, but notlimited to, a germanium poly alloy. The deposited film of the fin bodycan have a thickness in the nanometer range, for example, a thickness inthe range of 10 to 30 nanometers. The deposited film of the fin body canbe constructed as multi films of various materials. Process flows, astaught herein, can provide FinFET devices having deposited fin bodies,while avoiding small features standing by themselves in the devices. Forexample, such processing can avoid free standing features of less than24 nm. Such process flows used for forming arrays of cells can beperformed as cross-point processes that avoid misalignments. The arrayof cells can be memory cells in a semiconductor based memory device.

A FinFET having a deposited fin body provides a device having differentsurface characteristics compared to conventional FinFETs. ConventionalFinFETs have fin bodies formed by etching of a block of material suchas, for example, by dry etching. A thick film of poly grown on a surfacecan grow very large grains that can span several cells. Many cells willtherefore “see” crystalline semiconductor material, such as crystallinesilicon, but often an etched out thin fin will include one of the grainboundaries and have very different leakage characteristics compared tothe those fins that do not have grain boundaries from the large grains.Another issue associated with large grains is crystal orientation. <111>planes have different mobility compared to <100> or <110> planes andwill yield variation in maximum current drive in the on-state (Ion).Gate oxide growth can also vary with crystal orientation of the largegrain. On the other hand, a thin deposited film will be more amorphousor crystallize in small crystals that are much smaller than a fin sizeand provide more uniform material due to statistical distribution ofmany small poly crystals inside the fin. The material might be worse byaverage compare to fins without a grain boundary but better than finscontaining a large grain boundary. Uniformity by statisticalcharacteristics of many small poly grains of the deposited film canoutweigh better performance of cells within a large grain without agrain boundary that are combined with worse performance of cells havinggrain boundaries of the large grains in the etched fin. The differencesbetween a FinFET having a deposited fin body, as described herein, and aconventional FinFET may be observed, in many examples, through enhancedleakage characteristic of the FinFET having a deposited fin bodycompared with the conventional FinFET. FinFET devices having depositedfin bodies can also be structured without small features standing bythemselves in the devices as residuals of the FinFET processing, whichtypically accompany formation of conventional FinFETs.

The FinFETs with deposited fin bodies can be fabricated for a number ofdifferent applications. FinFETs, individually or as a group, can beformed in an integrated circuit. For example, in integrated circuitdevices, a FinFET may be used as an access component device. In anelectronic memory, each memory cell of a memory array of the electronicmemory can include a FinFET to access a storage element of the memorycell. As taught herein, fabrication of a set of FinFETs having finbodies for different device application can include similar fabricationtechniques for the deposition of the fin bodies.

FIG. 1 is a flow diagram of features of an embodiment of an examplemethod 100 of fabricating a FinFET with a deposited fin body. At 110, astructure is formed extending from a base on a substrate, where thestructure has a first dielectric with a dielectric surface extendingfrom the base, and the structure has a first conductive region withinthe first dielectric. Forming the structure extending from the base onthe substrate can include forming the first conductive region extendingfrom above the base to a level less than a top surface of the structure;and forming the first dielectric as part of a first region adjacent toand contacting the first conductive region. The first dielectric and thefirst region may have the substantially same dielectric oxidecomposition. The dielectric oxide composition can include, but is notlimited to, silicon oxide. Forming the structure extending from the baseon the substrate can include forming the base by forming a conductiveregion on the substrate, where the conductive region can be formed as adigitline for the device; and forming a doped region on and contactingthe digitline such that the structure is formed extending from the dopedregion.

At 120, material is deposited on the dielectric surface, forming a finbody of a fin field effect transistor. Depositing material on thedielectric surface can include depositing a polycrystalline siliconmaterial. Other polycrystalline semiconductor material can be used. Thedeposition can include, but is not limited to, chemical vapordeposition, atomic layer deposition, or variations thereof.

At 130, a second dielectric is formed contacting the fin body on asurface of the fin body opposite the dielectric surface of the firstdielectric. The first dielectric and the second dielectric can be formedof the same material. Such dielectrics can include silicon oxide or ahigh-κ dielectric material. A high-κ dielectric material is a dielectricmaterial having a dielectric constant (κ) higher than the dielectricconstant of silicon dioxide. At 140, a second conductive region isformed on the second dielectric, where the second conductive region isseparated from the fin body by the second dielectric. The secondconductive region may be composed of the same material as the firstconductive region. For example, the first and second conductive regionscan include, but are not limited to, titanium nitrite.

At 150, a doped region to the fin body is formed. Forming the dopedregion to the fin body can include forming the doped region on a portionof the deposited material that is substantially perpendicular to theformed fin body. The doped region and the deposited material forming thefin body can be composed of the same material, but with the doped regiondoped more heavily than the deposited material, which may be undoped ordoped at orders of magnitude less than the doped region. For example, ifdoped, the deposited material may be doped at around 10¹⁵ cm⁻³, whilethe doped region may be 10¹⁸ cm⁻³. The fabricated FinFET can be coupledwith one or more other components of a device for which the FinFET isconstructed.

FIG. 2 is a flow diagram of features of an embodiment of an examplemethod 200 of fabricating a memory device having multiple FinFETs withdeposited fin bodies. At 210, multiple structures are formed extendingfrom a base on a substrate, including forming each structure having afirst conductive region and a second conductive region embedded in afirst dielectric and separated from each other by the first dielectric.Each formed structure has a first dielectric surface extending from thebase and extending from the first conductive region in the structure anda second dielectric surface extending from the base and extending fromthe second conductive region in the structure. Forming multiplestructures extending from the base can include forming the base along adigitline line for the device. Fabricating the memory device can includepatterning in a direction perpendicular to the digitline line forming anarray of cells coupled to multiple digitlines, where each digitline isphysically and electrically separate from each other.

At 220, material is deposited on the first and second dielectricsurfaces of each structure, forming multiple fin bodies for multiple finfield effect transistors. Depositing the material forming multiple finbodies for multiple fin field effect transistors can include depositingthe material for a 48 nm array pitch. Prior to depositing material onthe first and second dielectric surfaces of each structure, method 200or methods identical or similar to method 200 can include forming a thinpolycrystalline semiconductor region on the first and second dielectricsurfaces of each structure; and depositing material on the first andsecond dielectric surfaces of each structure can include depositing thematerial on the thin polycrystalline semiconductor region, the thinpolycrystalline semiconductor region being thin relative to thedeposited material.

Method 200 or methods similar to method 200 can include depositingmaterial forming multiple fin bodies to include depositing the materialby chemical vapor deposition or by atomic layer deposition. Such methodscan include depositing material forming multiple fin bodies to includeforming each fin body to have a thickness in the range of 10 angstromsto 100 angstroms. Depositing material on the first and second dielectricsurfaces of each structure can include depositing the material on adoped region formed on and contacting a conductive region formed on thesubstrate, the conductive region formed as a digitline for the device.Forming the multiple fin field effect transistors can include formingthe multiple fin field effect transistors material deposited on thedoped region formed on and contacting the conductive region.

At 230, a second dielectric is formed between each structure of themultiple structures contacting the deposited material of each structureof the multiple structures. Each second dielectric includes a thirdconductive region and a fourth conductive region embedded in the seconddielectric between two structures of the multiple structures, where thethird conductive region and the fourth conductive region are separatedfrom each other by the second dielectric. Method 200 or a methodidentical or similar to method 200 can include forming the first,second, third, and fourth conductive regions as titanium nitride gates.Other conductive material may be used as gates. Such conductive materialcan be conductive material having low ohmic resistivity.

At 240, a doped region is formed connected to the deposited material,where the doped region is formed on the multiple structures and seconddielectric opposite the base. The doped regions and the depositedmaterial may be formed of poly semiconductor material in which thedeposited material may be undoped or lightly doped relative to the dopedregions. At 250, portions of the doped region, the deposited materialfor the fin bodies, and the second dielectric are removed, to define themultiple fin field effect transistors, each fin field effect transistorhaving two gates.

At 260, the fin field effect transistors are coupled to charge storageelements. Coupling the fin field effect transistors to charge storageelements may include forming a capacitor coupled to a portion of thedoped region, formed on the multiple structures and on the seconddielectric opposite the base, remaining after removing a portion of thedoped region.

FIGS. 3-14 illustrate features for an embodiment of a process that formsa deposited fin body of a FinFET in a device. FIG. 3 is representationof a cross-sectional view of a structure 302 having materials formed ona substrate 3 in the fabrication of the device. Substrate 3 may be asilicon-based substrate or other semiconductor based substrate. Thisview in FIG. 3 is along what will be a digitline 10 of the device inthis example embodiment. Digitline 10 is formed as a conductive region.The conductive material for digitline 10 can include tungsten (W), forexample. Other conductive material can be used, for example, conductivematerial having a low ohmic resistivity. For convenience of reference,the cross-sectional view is taken to be in the x-y plane.

A doped region 15 can be formed on digitline 10, and a dielectric region320 can be formed on and contacting doped region 15. Doped region 15 cana doped n-type or p-type semiconductor, and can be formed as a heavilydoped region, n+ or p+, relative to fin bodies of FinFETs to bestructured. The semiconductor can be realized as a poly semiconductor.Optionally, a barrier region may be formed between doped region 15 anddigitline 10. Dielectric region 320 can be formed as an oxide such as,but not limited to, silicon oxide. A sacrificial region 325 can beformed on the dielectric region 320. Sacrificial region 325 can be usedto form various structures coupled to digitline 10. An appropriatematerial that can be used as sacrificial region 325 is an insulatingnitride. Silicon nitride can be used as sacrificial region 325, thoughother materials may be used. Digitline 10, dielectric region 320, anddoped region 15 can be formed using conventional processing of materialregions in a semiconductor-based device.

At this point in the process, a number of digitlines with materialregions formed thereon as shown in FIG. 3 can be patterned parallel todigitline 10 in the z direction, though not shown here for ease ofdiscussion. The digitlines may be formed as part of an array with aselected pitch. For example, the digitlines may be formed with a 48 nmpitch. Such a 48 nm pitch can include 24 nm of structure and 24 nm ofspace. The digitlines in the completed structure provide signal lines.

FIG. 4 illustrates change to structure 302 of FIG. 3 after processing toremove selected regions of sacrificial region 325. The removal of theselected regions can be performed by etching sacrificial region 325 withan appropriate mask to provide a pattern on digitline 10. This patterncan provide trenches 426 forming structure 402. The pattern may beselected such that each trench 426 can have a 24 nm length along thedirection of digitline 10. The trenches 426 can be separated from eachother along the digitline 10 by a length of 24 nm of sacrificial region325. Other trench patterns may be implemented.

FIG. 5 illustrates change to structure 402 of FIG. 4 after processing tofill the trenches 426 and conducting a chemical mechanical polish (CMP).In this processing, each trench 426 can be filled with a conductiveregion. The conductive region can be formed of TiN, for example. Otherconductive materials may be used. These conductive regions can besubjected to a spacer etch such that, in each previously unfilled trench426, the conductive region remaining has two conductive regions 527separated from each other. The conductive regions 527 can be used toform first access lines. Such first access lines can be substantiallyperpendicular to digitline 10 in the z-direction. The first access linesmay be word lines. The region of separation between the two conductiveregions 527 can be filled with a dielectric material 528. Dielectricmaterial 528 can be formed of the same material as the material ofdielectric region 320. Dielectric material 528 can be an oxide such as,but not limited to, silicon oxide. After filing the trenches 426, achemical mechanical polish (CMP) can be conducted forming structure 502.

FIG. 6 illustrates change to structure 502 of FIG. 5 after processing torecess material between the sections of sacrificial region 325 and tofill the removed regions between the sections of sacrificial region 325to form structure 602. In this processing, the two conductive regions527 and dielectric material 528 can be etched to recess the twoconductive regions 527 and dielectric material 528 from the top surface626 of sacrificial region 325. The removed portion of the two conductiveregions 527 and dielectric material 528 can be filled with a dielectricregion 629. The material of dielectric region 629 can be the same incomposition as the material of dielectric material 528. One or both ofthe materials of dielectric material 528 and dielectric region 629 maybe an oxide. CMP may then be conducted.

FIG. 7 shows change to structure 602 of FIG. 6 after etching to removethe remaining portions of the sacrificial region 325, forming structure702. A wet etch may be used. After the etch, separated columns ofmaterial, along the direction of digitline 10, extend from dielectricregion 320. Each column includes two conductive regions 527 separated bydielectric material 528 with dielectric region 629 disposed on the twoconductive regions 527 and the dielectric material 528.

FIG. 8 shows change to the structure 702 of FIG. 7 after etching toremove the dielectric region 320 between the columns on doped region 15,forming structure 802. The etch exposes the portions of doped region 15that are between the columns having two conductive regions 527 on theremaining dielectric region 320 and separated by dielectric material 528with dielectric region 629 on the two conductive regions 527 and thedielectric material 528. Structure 802 includes repeated pairs ofconductive regions 527 separated from the doped region 15 on digitline10.

FIG. 9 shows change to the structure 802 of FIG. 8 after depositing agate dielectric 930 adjacent to the two conductive regions 527 of eachcolumn. Gate dielectric 930 can be realized as a gate oxide. Gatedielectric 930 can include silicon, a high-κ dielectric, or combinationsof dielectric materials. The deposition of gate dielectric may beconducted by depositing the gate dielectric 930 covering the twoconductive regions 527 of each column and the exposed portions of dopedregion 15 of structure 802 followed by a spacer etch to remove portionsof the deposited gate dielectric 930 re-exposing portions of dopedregion 15. Dielectric region 629 may remain as dielectric region 629,may be replaced by material of gate electric 930, or may be acombination of the material of dielectric region 629 and material ofgate dielectric 930. This portion of the fabrication process can providethe first gate dielectric for the fin bodies of FinFETs beingfabricated. Optionally, a thin region 934 of material that will form thefin bodies can be deposited on the first gate dielectric. The depositionof the first dielectric for the fin bodies of FinFETs followed by thespacer etch provides structure 902 with repeated columns, along thedigitline 10, in which two conductive regions 527 are embedded indielectric material disposed on doped region 15 on digitline 10.

FIG. 10 shows change to the structure 902 of FIG. 9 after depositingmaterial 1035 for fin bodies across the surface, forming structure 1002.The material for the fin bodies can be a polycrystalline semiconductormaterial. The poly material can be undoped semiconductor material orsemiconductor material doped lightly with respect to the doping level ofthe doped region 15. Depositing material 1035 may be the same materialas doped region 15, but undoped or doped lightly with respect to thedoping level of the doped region 15. Each conductive region 527 isseparated from deposited material 1035 by gate dielectric 930, which isadjacent to the two conductive regions 527 of each column. Processing ofthe deposited material 1035 can be conducted in the z direction formingthe repeated structured shown in FIG. 10, substantially parallel to inthe digitline 10. At this point, the deposited material 1035 can bepatterned along the direction of digitline 10 using an isotropic etch.This processing can be conducted to form an array with a 30 nm line/18nm trench pattern for a 48 nm pitch. Other patterns may be implemented.

FIG. 11 shows change to the structure 1002 of FIG. 10 after depositingdielectric material 1132 on the surface of structure 1002, formingstructure 1102. Dielectric material 1132 can be deposited to provide asecond gate dielectric for the FinFETs being formed. Dielectric material1132 can be an oxide. Dielectric material 1132 can include silicon, ahigh-κ dielectric, or combinations of dielectric materials. Dielectricmaterial 1132 may have the same composition as gate dielectric 930. Thedeposition of the second dielectric for the fin bodies of FinFETsfollowed by a spacer etch provides structure 1102 with repeated columns,along the digitline 10, are separated by trenches 1124.

FIG. 12 shows change to the structure 1102 of FIG. 11 after depositing aconductive material in trenches 1124, conducting a spacer etch to formtwo conductive regions 1237 on dielectric material 1132 in trenches1124, and filling the remaining portions of trenches 1124 withdielectric material 1236, forming structure 1202. Dielectric material1236 fills the region between the two conductive regions 1237 inpreviously formed trenches 1124. Dielectric material 1236 can have thesame composition as gate dielectric 930 and/or gate dielectric 1132.Dielectric material 1236 can be an oxide. Conductive regions 1237 may becomposed of TiN. Other conductive material can be used. Conductiveregions 1237 may be composed of the same material as conductive regions527. Conductive regions 1237 form portions of second access lines. Suchsecond access lines may be formed substantially perpendicular todigitline 10. The second access lines may be word lines. The processingconducted to include the z-direction for the array being formed.

FIG. 13 shows change to the structure 1202 of FIG. 12 forming structure1302 after conducting a CMP to remove portions of dielectric material1132 and 1236 to expose portions of deposited material 1035 near the topof structure 1202 distal from doped region 15, followed by forming dopedregion 1340 across the surface in the direction of the digitline 10.Doped region 1340 may have substantially the same composition as dopedregion 15. Doped region 1340 may have substantially the same compositionas doped region 15 with variations in doping. Doped region 1340 anddoped region 15 can have substantially the same composition as depositedmaterial 1035, but doped more highly relative to deposited material1035.

FIG. 14 shows change to the structure 1302 of FIG. 13 after removingportions of doped region 1340, deposited material 1035, and dielectricmaterial 1236, forming structure 1402. Removing these portions providesmultiple cells along the digitlines, such as cells 1405. As withprevious figures, FIG. 14 shows a cross-sectional view along digitline10. Digitlines and access lines can be patterned by any suitableprocess, for example using 193 nm immersion lithography. Cells 1405include fin body 1035 coupling doped region 15 to doped region 1340 withfin body separated from gates 527 and 1237 by gate dielectrics 930 and1132, respectively, and with doped region 15 coupled to digitline 10.Fin body 1035, which includes the channel for the FinFET of cell 1405,can be disposed substantially perpendicular to the plane that includesthe surface of digitline 10.

Each of the cells 1405 can be further processed as part of a cell of anarray in a device. For example, each of the cells 1405 can be formed asmemory cells of an array of a memory device. In processing the array,the access lines, realized as gates 527 and 1237 that extend in thez-direction with respect to digitlines 10, can be cut at the end of thearray to avoid shorts. In an embodiment, for each of the cells 1405, thedigitline connects the array to one or more circuits outside the array.For a memory array, with each cell 1405 processed to connect each dopedregion 1340 to an individual charge storage element 1442, the digitline10 can connect a sense amplifier, for example, to each charge storageelement 1442 via the access transistor formed by the FinFET comprisingfin body 1035, doped region 15, doped region 1340, gates 527 and 1237,and gate dielectrics 930 and 1132. All the FinFETs along a digitline 10can be connected on one side to a digitline 10, while the top of eachFinFETs at 1340 can be connected to an individual capacitor to holdinformation charge (+ or −). Other types of charge storage elements canbe used. The cells 405 coupled with charge storage elements 1442 may beused in dynamic random access memories (DRAMs). Poly FinFETs, taughtherein, can be used as selector devices in a three dimensional (3D)flash memory and they can be used in a 3D ferroelectric memory (FRAM).These applications have less critical off current criteria than DRAM, asthe charge is not stored in a capacitor and subject to transistorleakage, but the information is stored in ferroelectric material or in afloating poly gate. Improved smaller poly devices also can have NANDapplications. In NAND, the poly devices can be much larger as they areused for a digit line select rather than a cell element. The portion ofthe region 1035 formed parallel to digitline 10, using an embodiment ofthe technique taught herein, is a part of an interconnect of the FinFETsto the digitline 10. The material of region 1035 forming the channel,which is the fin body, of the FinFETs and the part of the interconnectcan be a poly material. The material for gates 527 and 1237 anddigitline 10 can be low ohmic material. For example, gates/access lines527 and 1237 can include TiN and digitline 10 can include W, thoughother low ohmic materials may be used. The portion of the region 1035formed parallel to digitline 10 adds capacitance without reducingresistance significantly, and, hence, makes signally at this partslower. However, the portion of the region 1035 formed parallel todigitline 10 provides for the contact area between the fin body ofregion 1035, which extends to doped region 1340, and the conductivedigitline 10 to be larger that contact to the fin body of region 1035and such contact area is more reliable than a smaller contact areadirectly to the fin body of region 1035.

The processing associated with FIGS. 3-14 can be implemented with anarray count with 193 immersion processing with respect to the digitlinesof 24 nm/24 nm line/space, 193 dry processing with respect to the accesslines of 24 nm/72 nm trench/line, 193 immersion processing with respectto the fin body in the digitline direction of 30 nm/18 nm line/space,193 immersion processing with respect to the digitline landing pad of 30nm/18 nm line/space, and 193 immersion processing with respect to theaccess line landing pad of 30 nm/18 nm line/space. Other array countsmay be used.

Processing similar to the techniques associated with FIGS. 3-14 can beused to form one or more individual FinFETs with deposited fin bodiesthat are not part of an array of memory cells in an integrated circuit.Such processing can be conducted with appropriate masking such thatdigitline 10 is a signal line coupled to only one cell 1405 to perform afunction according to a particular design for the integrated circuit inwhich it is being fabricated.

FIG. 15 is a block diagram of an example embodiment of an example memory1500. Memory 1500 can include a memory array 1501 having a plurality ofmemory cells, where each memory cell includes a FinFET 1505. A memoryarray is a systematic physical arrangement of memory cells that can belogically arranged according to a plurality of parameters. In variousembodiments, each memory cell can be addressed according to values oftwo parameters. The two parameters may be referred to as a row and acolumn. A memory cell may be logically located in the memory array andindexed uniquely according to a value for a row and a value for acolumn. Rows and columns are not limited to a particular physicalorientation or linear relationship, so that the logical arrangement canbe vastly different than the physical arrangement. A column of a memoryarray may be arranged as a group of memory cells that can be accessed atthe same time by a decoder assigned to column values. A row of a memoryarray may be arranged as a group of memory cells that can be accessed atthe same time by a decoder assigned to row values.

FinFETs 1505 of the memory cells of memory array 1505 can be realized asFinFETs having deposited fin bodies. Such FinFETs having deposited finbodies can be structured and formed in accordance with structures andprocessing as taught herein. Each FinFET can be coupled to one of anumber of digitlines DL(0), DL(1), . . . DL(N)s at one end of the FinFET1505 and to a capacitor at the other end of the FinFET 1505, where thetwos ends are coupled to each other by the fin body of FinFET 1505.Digitlines DL(0), DL(1), . . . DL(N)s can be coupled to a senseamplifier 1540. Sense amplifier 1540 operates to determine the value ofinformation read from the capacitor of a selected memory cell accessedvia its FinFET 1505. Access to the selected memory cell can be achievedthrough access lines that can be structured as access lines WL(1),WL(2), WL(3), WL(4) . . . WL(M−1), WL(M). Pairs of access lines can becoupled to a FinFET 1505. For example, WL(1) and WL(2) are coupled tothe same set of FinFETs 1505, WL(3) and WL(4) are coupled to the sameset of FinFETs 1505 . . . WL(M−1) and WL(M) are coupled to the same setof FinFETs 1505 s. Signals on the set of access lines WL(1), WL(2),WL(3), WL(4) . . . WL(M−1), WL(M) can be controlled by access linedrivers 1550.

In various embodiments, a device can comprise: a digitline; a firstdielectric; a deposited fin body extending from a first doped regioncontacting the digitline to a second doped region distal from thedigitline, the deposited fin body deposited on the first dielectric; afirst gate separated from the deposited fin body by the firstdielectric; a second dielectric adjacent the deposited fin body on aside of the deposited fin body opposite the first dielectric; and asecond gate separated from the deposited fin body by the seconddielectric. The deposited fin body can have a thickness in the range of10 angstroms to 100 angstroms. The first doped region contacting thedigitline can include material of the fin body doped to a higher levelthan the material of the fin body. The first doped region contacting thedigitline, the first dielectric, the first gate, the second dielectric,the second gate, and the fin body can be structured as an accesstransistor in the device.

In various embodiments, a device can comprise a number of digitlines andmultiple fin field effect transistors disposed on each digitline. Eachfin field effect transistor on each digitline can include a firstdielectric; a deposited fin body extending from a first doped regioncontacting the digitline to a second doped region distal from thedigitline, the deposited fin body deposited on the first dielectric; afirst gate separated from the deposited fin body by the firstdielectric; a second dielectric adjacent the deposited fin body on aside of the deposited fin body opposite the first dielectric; and asecond gate separated from the deposited fin body by the seconddielectric. The device can comprise multiple access lines, each accessline coupled to the first gate and the second gate of a different one ofthe multiple fin field effect transistors.

Such a device or a similar or identical device can include a number offeatures. The deposited fin body can include a polycrystallinesemiconductor material. The deposited fin bodies of directly adjacentfin field effect transistors disposed on the same digitline can becoupled to each other by a region disposed on and contacting the firstdoped region contacting the digitline, the region composed of thepolycrystalline semiconductor material. The first gate of a fin fieldeffect transistor of the multiple fin field effect transistors can beseparated from the second gate of a directly adjacent fin field effecttransistor disposed on the same digitline by an oxide. The multiple finfield effect transistors disposed on each digitline of the number ofdigitlines can be structured having a 48 nm array pitch.

FIG. 16 illustrates an example of a wafer 1600 arranged to providemultiple electronic components. Wafer 1600 can be provided as a wafer inwhich a plurality of dice 1604 can be fabricated. Alternatively, wafer1600 can be provided as a wafer in which the plurality of dice 1604 havebeen processed to provide electronic functionality and are awaitingsingulation from wafer 1600 for packaging. Wafer 1600 can be provided asa semiconductor wafer, a semiconductor on insulator wafer, or otherappropriate wafer for processing electronic devices such as anintegrated circuit chips. Wafer 1600 can be fabricated in accordancewith any one or more embodiment related to FIGS. 1-15.

Using various masking and processing techniques, each die 1604 can beprocessed to include functional circuitry such that each die 1604 isfabricated as an integrated circuit with the same functionality andpackaged structure as the other dice on wafer 1600. Alternatively, usingvarious masking and processing techniques, various sets of dice 1604 canbe processed to include functional circuitry such that not all of thedice 1604 are fabricated as an integrated circuit with the samefunctionality and packaged structure as the other dice on wafer 1600. Apackaged die having circuits integrated thereon providing electroniccapabilities is herein referred to as an integrated circuit (IC).

Wafer 1600 can include multiple dice, where each dice includes a signalline with a FinFET, having a deposited fin body, coupled to the signalline. In an embodiment, wafer 1600 can include multiple dice, in whicheach die 1604 of the multiple dice includes a digitline, and a FinFETcoupled to the digitline, where the FinFET has a first dielectric; adeposited fin body extending from a first doped region contacting thedigitline to a second doped region distal from the digitline, thedeposited fin body deposited on the first dielectric; a first gateseparated from the deposited fin body by the first dielectric; a seconddielectric adjacent the deposited fin body on a side of the depositedfin body opposite the first dielectric; and a second gate separated fromthe deposited fin body by the second dielectric. Each die 1604 caninclude a number of digitlines with multiple fin field effecttransistors disposed on each digitline. The multiple FinFETs disposed oneach digitline of the number of digitlines can be structured having a 48nm array pitch. The deposited fin body of FinFETs in die 1405 caninclude multiple material compositions. The digitline in each die can becoupled to a sense amplifier in each die.

FIG. 17 shows a block diagram of a system 1700 that includes one or morecomponents have a FinFET with a deposited fin body. The deposited finbody can be realized in a manner similar to or identical to structuresin accordance with various embodiments as taught herein. Such structurescan include the deposited fin body constructed in a process similar toor identical to processes in accordance with various embodiments astaught herein. The FinFET with a deposited fin body can be disposed inany of the components of system 1700 as access transistor to one or moreindividual circuit elements or one or more circuits.

System can include a controller 1761 operatively coupled to memory 1763.System 1700 can also include an electronic apparatus 1767 and peripheraldevices 1769. One or more of controller 1761, memory 1763, electronicapparatus 1767, and peripheral devices 1769 can be in the form of one ormore ICs. A bus 1766 provides electrical conductivity between and/oramong various components of system 1700. In an embodiment, bus 1766 caninclude an address bus, a data bus, and a control bus, eachindependently configured. In an alternative embodiment, bus 1766 usescommon conductive lines for providing one or more of address, data, orcontrol, the use of which is regulated by controller 1761. Controller1761 can be realized in the form or one or more processors.

Electronic apparatus 1767 may include additional memory. Memory insystem 1700 may be constructed with one or more types of memory such as,but not limited to, dynamic random access memory (DRAM), static randomaccess memory (SRAM), synchronous dynamic random access memory (SDRAM),synchronous graphics random access memory (SGRAM), double data ratedynamic ram (DDR), double data rate SDRAM, and magnetic based memory.Peripheral devices 1769 may include displays, imaging devices, printingdevices, wireless devices, additional storage memory, and controldevices that may operate in conjunction with controller 1761.

A FinFET with a deposited fin body, as taught herein, can be implementedin one or more of controller 1761, memory 1763, electronic apparatus1767, peripheral devices 1769, and bus 1766. In various embodiments,system 1700 can include, but is not limited to, fiber optic systems ordevices, electro-optic systems or devices, optical systems or devices,imaging systems or devices, and information handling systems or devicessuch as wireless systems or devices, telecommunication systems ordevices, and computers.

Although specific embodiments have been illustrated and describedherein, it will be appreciated by those of ordinary skill in the artthat any arrangement that is calculated to achieve the same purpose maybe substituted for the specific embodiments shown. Various embodimentsuse permutations and/or combinations of embodiments described herein. Itis to be understood that the above description is intended to beillustrative, and not restrictive, and that the phraseology orterminology employed herein is for the purpose of description. Inaddition, in the foregoing Detailed Description, it can be seen thatvarious features are grouped together in a single embodiment forstreamlining the disclosure. This method of disclosure is not to beinterpreted as reflecting an intention that the claimed embodimentsrequire more features than are expressly recited in each claim. Thus,the following claims are hereby incorporated into the DetailedDescription, with each claim standing on its own as a separateembodiment.

What is claimed is:
 1. A method of fabricating a device having a finfield effect transistor, the method comprising: forming a fin fieldeffect transistor including; forming a structure extending from a baseon a substrate, including forming the structure having a firstdielectric with a dielectric surface extending from the base, thestructure having a first conductive region within the first dielectricwith the first dielectric having a portion of the first dielectric ontop of the first conductive region; depositing material on thedielectric surface and on the portion of the first dielectric on top ofthe first conductive region, and maintaining at least a portion of thedeposited material to form a fin body of the fin field effecttransistor; forming a second dielectric contacting the fin body on asurface of e fin body opposite the dielectric surface of the firstdielectric; forming a second conductive region on the second dielectric,the second conductive region separated from the fin body by the seconddielectric; and forming a doped region to the fin body.
 2. The method ofclaim 1, wherein forming the structure extending from the base on thesubstrate includes: forming the first conductive region extending fromabove the base to a level less than a top surface of the structure; andforming the first dielectric as part of a first region adjacent to andcontacting the first conductive region.
 3. The method of claim 2,wherein the first dielectric and the first region have a substantiallysame dielectric oxide composition.
 4. The method of claim 1, whereinforming the structure extending from the base on the substrate includesforming the base by: forming a conductive region on the substrate, theconductive region formed as a digitline for the device; and forming adoped region on and contacting the digitline such that the structure isformed extending from the doped region.
 5. The method of claim 4,wherein the conductive region formed as a digitline includes tungsten.6. The method of claim 1, wherein depositing material on the dielectricsurface includes depositing a polycrystalline silicon material.
 7. Themethod of claim 1, wherein forming the doped region to the fin bodyincludes forming the doped region on a portion of the deposited materialthat is substantially, perpendicular to the formed fin body.
 8. Themethod of claim 1, comprising coupling the doped region to a chargestorage element.
 9. The method of claim 8, wherein the charge storageelement is a capacitor.
 10. A method of fabricating a device havingmultiple fin field effect transistors, the method comprising: forming astructure extending from a base on a substrate, including forming thestructure having a first dielectric extending from the base, thestructure having a first conductive region separated from a secondconductive region by the first dielectric with the first dielectrichaving a portion of the first dielectric on top of the first conductiveregion and on top of the second conductive region; forming a seconddielectric extending from the base with the second dielectric formedalong and contacting the first conductive region; forming a thirddielectric extending from the base with the third dielectric formedalong and contacting the second conductive region such that the firstconductive region and the second conductive region are within adielectric region formed by the first, second, and third dielectric;depositing material on the dielectric region such that a first portionof the material is along and contacting the second dielectric oppositethe first conductive region, a second portion of the material is alongand contacting the third dielectric opposite the second conductiveregion, and a top portion of the material is on the portion of the firstdielectric on top of the first and second conductive regions; forming adoped region on the top portion of the material; and removing a portionof the doped region and a portion of the top portion of the material onwhich the portion of the doped region is formed, such that a first finbody of a first fin field effect transistor is formed including thefirst portion of the material and a second fin body of a second finfield effect transistor is formed including the second portion of thematerial.
 11. The method of claim 10, wherein, after removing theportion of the doped region and the portion of the top portion of thematerial, the first fin body includes a first part of a remaining topportion of the material and the second fin body includes a second partof the remaining top portion of the material.
 12. The method of claim10, wherein the first and second conductive regions are formed on alower dielectric region, with the lower dielectric region on andcontacting the base.
 13. The method of claim 12, comprising forming thebase along a digitline for the device.
 14. The method of claim 13, thematerial on the dielectric region is undoped or doped at orders ofmagnitude less than a doping level of the base.
 15. The method of claim13, comprising forming additional fin field effect transistors inadditional to the first and second fin field effect transistors suchthat fin bodies of the additional fin field effect transistors, thefirst fin field effect transistor, and the second fin field effecttransistor are deposited on and contacting the base with the base on andcontacting the digitline.
 16. The method of claim 15, wherein formingthe additional fin field effect transistors, the first fin field effecttransistor, and the second fin field effect transistor includes formingthe additional fin field effect transistors, the first fin field effecttransistor, and the second fin field effect transistor with two gateswith the respective fin body between the two gates.
 17. A device havinga fin field effect transistor, the device comprising: a fin field effecttransistor having a channel for transistor operation, with the fin fieldeffect transistor including: a structure extending from a base on asubstrate, the structure having a first dielectric with a dielectricsurface extending from the base and having a first conductive regioncontacting the first dielectric on a side of the first conductiveregion, with the first dielectric having a portion of the firstdielectric on top of the first conductive region; a deposited fin bodyof the fin field effect transistor on the dielectric surface and on theportion of the first dielectric on top of the first conductive region,the deposited fin body structured vertically including the channel ofthe fin field effect transistor; a second dielectric contacting the finbody on a surface of the fin body opposite the dielectric surface of thefirst dielectric; a second conductive region adjacent and contacting thesecond dielectric, the second conductive region separated from the finbody by the second dielectric; and a doped region on and contacting thefin body opposite the substrate.
 18. The device of claim 17, wherein thefin body is on and contacting the base with the base contacting adigitline.
 19. The device of claim 18, comprising additional fin fieldeffect transistors arranged such that fin bodies of the additional finfield effect transistors are on and contacting the base with the basecontacting the digitline.
 20. The device of claim 17, wherein the dopedregion is coupled to a charge storage element.